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Advantest Scales up ATE with New High-Current Power Supply

Leading semiconductor test equipment supplier Advantest Corporation has announced the newest addition to its portfolio of power supplies for the V93000 EXA Scale SoC test platform.

The DC Scale XHC32 power supply offers 32 channels with an unprecedented single-instrument total current of up to 640A. This feature enables the card to efficiently address the rapidly rising power requirements for artificial intelligence (AI) accelerators, high-performance computing (HPC) chips, graphical processing units (GPUs), and other high-current devices like network switches and high-end application processors.

DC Scale XHC32 power supply

Extends Capability of V93000 EXA Scale Platform

Very high current requirements of 1000A or more at core voltages below 1V require an automated test equipment (ATE) system with precise power-delivery capabilities. Mainly, the DC Scale XHC32 further extends the V93000 EXA Scale platform, covering all high-power requirements with a single card. As a result, it enables unlimited and flexible ganging of channels, fast load step, and clamp response. Also, it allows extended profiling capabilities.

“Our customers are increasingly asking for solutions that can perform multisite parallel test of 2.5/3D devices with extremely high-current requirements,” said Ralf Stoffels, general manager, and executive vice president of Advantest’s V93000 Product Unit.

Primarily, the DC Scale XHC32 features an unprecedented delivery of 640A from a single card. Also, it has unique safety capabilities for unmatched equipment protection. Thus, the DC Scale XHC32 is an excellent fit for testing all types of digital devices with high power demands.

Additionally, the DC Scale XHC32 provides full application compatibility with the existing DC Scale UHC4T card. Accordingly, it enables a seamless transition to the new generation of high-power supplies. At the same time, it enables reuse of existing device-under-test (DUT) boards efficiently.

By making use of the patented new contact protection, the DC Scale XHC32 reduces cost of test (CoT). Mainly, it eliminates the risk of damaging probe cards and test sockets. This new feature will allow customers to test high-current AI and HPC applications safely. Moreover, it will protect their overall investment in test equipment.

Further, the new high-density power supply enables customers to optimize their investment by using smaller test head infrastructures or to increase multisite testing and reduce the overall CoT.

The XHC32 is already installed at several customer sites. It will be available to the global market beginning next month.

-20 May 2024-