JEOL Ltd. has released the new electron microscope JEM-120i developed with the concepts of compact, easy to use, and expandable.

Electron microscopes are utilized in a wide range of fields from biotechnology to nanotechnology, polymers, and advanced materials. As applications expand, so as their usage, which requires a tool that is easy-to-use for research and testing purposes. To satisfy such needs, JEM-120i by JEOL has evolved into a next-generation microscope that is easy to use, from operation to maintenance, for both beginner and experienced users.

Main Feature

Compact

Specifically, JEM-120i adopts a new appearance and compact design that fits any installation location. The footprint has been reduced by more than 50%, and the volume occupied by the instrument is less than one-third that of conventional models, enabling effective use of space. The instrument height is lower than 1,800mm, which fits just about any installation room.

Easy to use

The enhanced TEM control system and fully automated apertures eliminated the need for switching the magnification mode and selecting an aperture. Thus, JEM-120i provides seamless observations from low to high magnification.

It takes only four steps from loading a specimen to completing an observation. After inserting the specimen holder, clicking the Start Button automatically performs observation preparation operations, such as voltage increase and emission start.

At the same time, it captures a wide area image, and clicking the target field of view will complete the stage movement. Standard “Butler mode” assists data acquisition.

Even a beginner can capture data easily.

Expandable

In addition to the standard multi-function camera, a bottom-mount camera of higher pixel count is available as an option.

Attachments such as the scanning image observation function (STEM), elemental analysis function (EDS), and cryo observation function can be applied, regardless of instrument configuration. The instrument can be expanded at any time to meet the changing needs of microscopy over time.

The proven scripting function (PyJEM) with the high-end models, can create an algorithm for automation. The automation can increase the utilization rate of the instrument and improve data output efficiency.

-30 May 2024-