AEI

ASIA ELECTRONICS INDUSTRYYOUR WINDOW TO SMART MANUFACTURING

JEOL Unveils New Field Emission SEM

JEOL Ltd. has released the JSM-IT810 Schottky Field Emission Scanning Electron Microscope.

Generally, Field Emission Scanning Electron Microscopes (FESEM) are widely used in science and technology fields such as research institutes, universities, and industry. There is a growing demand for an instrument that can support easy, accurate, quick, and efficient observation to analysis.

JSM-IT810 Schottky Field Emission Scanning Electron Microscope

Primarily, JSM-IT810 integrates the “Neo Action” automatic observation and analysis function and automatic calibration function to the technologies of the JSM-IT800 model. Specifically, Neo Action aims to improve efficiency and productivity and help solve labor shortages. Meanwhile, JSM-IT800 features the next-generation electron optical control system “Neo Engine” and the “SEM Center” for high operability such as Zeromag and energy dispersive X-ray spectroscopy (EDS) integration.

Main Features

1. Automatic Observation and Analysis Function “Neo Action”

Users only need to select the SEM image acquisition conditions and field of view, and the function automatically performs SEM observation and EDS analysis. Specifically, this function contributes to improving the efficiency of routine work including analysis work.

2. Automatic Calibration Function “SEM Automatic Adjustment Package”

This function enables automatic execution of the selected items in alignment adjustment, magnification adjustment, and EDS energy calibration.

3. “Live Function”

Meanwhile, this function is capable of Live 3D, Live Analysis, and Live Map functions. 3D images can be constructed on the spot while an SEM observation is being performed to obtain unevenness and depth information. In addition, it helps to always display characteristic X-ray spectrum and elemental mapping.

4. EDS Integration

Further, it integrates SEM observation and EDS analysis. Also, analysis of point, area, and MAP can be performed from the observation screen. Incorporation of the Windowless EDS-Gather-X enables detection from Li and analysis at a high sensitivity and high spatial resolution.

JEOL targets annual sales of 220 units of the JSM-IT810 Schottky Field Emission Scanning Electron Microscope.

-30 July 2024-