proteanTecs, a global leader of deep data analytics for advanced electronics, and Teradyne, a leading supplier of automated test solutions, announced their strategic partnership to enhance semiconductor test and debug processes for advanced system-on-chips (SoCs). Through the partnership, the on-chip agent data and analytics software by proteanTecs are connected with Teradyne’s test programs. Thus, customers benefit from a new level of device visibility where they need it most – on the tester, for inline and real-time decisions.

Mainly, proteanTecs and Teradyne are already engaged with mutual customers in mission-critical applications. In fact, Alphawave Semi is using proteanTecs’ deep data analytics and Teradyne’s automated test solutions. Alphawave Semi is a global leader in high-speed connectivity for the world’s technology infrastructure. By leveraging the combined workflow, Alphawave Semi optimized its AVS flow to reach the minimum possible voltage to operate its device, which contains optical digital signal processing (DSP) technology acquired from Banias Labs.

“Teradyne is a leader in advanced test solutions. Its automated test equipment is widely used in markets where power, reliability, and performance are critical,” said Uzi Baruch, Chief Strategy Officer at proteanTecs. “By integrating our cloud and edge solutions with Teradyne’s advanced test environment, customers will gain access to cutting-edge testing to meet the growing industry demands.”

“Ensuring optimal test coverage to validate increasing device quality requirements is vital,” said Regan Mills, Vice President and General Manager, Semiconductor Test at Teradyne. “proteanTecs’ analytics provide high-resolution, parametric data that drives faster and deeper device learning. Our partnership with proteanTecs is centered around a shared goal of accelerating our customers’ time to market and improving the end product’s performance, longevity and quality.”

Moreover, the joint proteanTecs and Teradyne solution provides a simple method for retrieving data from on-chip Agents on a device under test (DUT). Also, it reports that data back to the user for real-time inference settings or up to the cloud for later processing. Specifically, this capability combined with advanced analytics and machine learning (ML) delivers insights from the chip, accurate outlier detection, personalized power optimization, per-die grading, and increased test coverage.

Additionally, proteanTecs’ solutions can now be instantiated in Teradyne’s IG-XL software via the Teradyne PortBridge tool. This can be used on Teradyne’s UltraFLEX and UltraFLEXplus testers.