Automated optical and X-ray inspection equipment innovator Saki Corporation will highlight its state-of-the-art solutions when it exhibits at the 38^th Nepcon Japan in Tokyo from January 24 to 26. Particularly, the company will highlight how its inline total inspection line solutions and software innovations will contribute to smart factories.

Saki will offer booth visitors a first-hand look at the unique features that prove its Full SMT Line, Smart Factory, and M2M capabilities. Accordingly, these include the latest hardware and software releases with an emphasis on total inspection line solutions. These solutions offer reliability, speed, quality, and value for applications across key sectors including automotive, EMS, and industrial markets.

Electrotest Japan – Booth 15-2 (East Hall 2)

Saki will showcase its innovative single-operation capabilities. In addition, together with a prototype of their software system called “One Programming / Saki Link”. This will serve as a showcase for the company’s data-driven approach to ongoing productivity enhancement. It features unified SPI, AOI, and AXI programming operability. In addition, device configurations come in batches using a shared data library.

Alongside the new software system, QD Analyzer and Multi Process View (MPV) demo station will present Saki’s software strength that greatly improves process troubleshooting and determines root causes. These innovations will help clients increase automation to solve labor & resourcing issues, tackle skills shortages, improve productivity, and achieve greater manufacturing quality and efficiency.

Power Device & Module EXPO – Booth 35-14 (East Hall 4)

The Power Device and Module Expo is a new addition to Nepcon Japan focusing on the automotive, energy, railroad, and industrial equipment sectors. Specifically, the design complements the power semiconductor manufacturing applications. Here, Saki will exhibit its latest X-ray total automatic inspection system for power modules, the AXI 3Xi-M200, on a dedicated Saki booth #35-14 in East Hall 4.

With its special Planar-CT (PCT) scanning method, combined with advanced in-house image-processing algorithms that calculate the luminance of each pixel in three dimensions to reconstruct images with the maximum possible accuracy, Saki’s X-ray solution fulfills inspection capabilities and flexibility required by semiconductor manufacturers far beyond standard SMT inspection processes with precision, speed, and ease.

“We are looking forward to once again showcasing our latest technologies at Nepcon Japan. With our range of inspection machine and software solutions we aim to help address changes and challenges faced by electronic manufacturers today and in the future,” said Ken Katsumi, Chief Sales Manager of Saki’s Sales Headquarters.